Wednesday, April 26, 2017 - 1:00pm to 4:30pm

Testing the Internet of Things

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The Internet of Things (IoT) is the next big technology challenge for software testing. IoT testing uses concepts from traditional and mobile environments but has new testing problems and new patterns. Jon Hagar begins by examining how to use data analytics from error profiles and social media to discover the new error patterns in IoT systems. Usage data on IoT devices is growing rapidly and becoming a big data issue. Through hands-on exercises, Jon explains how teams can use data analytics to improve development and testing. Next, he uses the analytics to define real-world test patterns to optimize exploratory and automated testing. Like software design patterns, which must be matched to a design problem, test patterns must be recognized as applicable to a particular test context. Jon explains when and how to employ these test patterns as well as when a pattern may or may not work.

Note: Participants practice the class patterns on IoT data and devices that Jon will provide.


Grand Software Testing

Jon Hagar is a systems software engineer and testing consultant, supporting software product integrity and verification and validation (V&V), with a specialization in mobile and embedded software system testing. For more than thirty years, Jon has worked in software testing and engineering projects. He authored Software Test Attacks to Break Mobile and Embedded Devices; consults, presents, teaches, and writes regularly in many forums on software testing and V&V; and is lead editor/author on committees including OMG UTP model-based test standard, IEEE 1012 V&V plans, and ISO/IEEE/IEC 29119 software test standard. Contact Jon at [email protected].